Monitoring & Diagnostics
While drowning in data but starving for information, let our Tool-@-A-Glance visualized manufacturing intelligence turns production data into real-time information to analyze manufacturing trends and improve Overall Tool Efficiency. Quartet Mechanics offers the remote diagnostics and web-based Tool-@-A-Glance performance monitoring system to reduce the trouble shooting cost and enable exception management.
Whenever monitored parameters deviate beyond pre-determined limits, an alarm email will be triggered to begin troubleshooting the problem by checking the real-time and historical operating data. The web-based charting brings consistent visualization of production performance that enables global collaboration to diagnose the root cause of the problem in realtime mode. Our system can combine two analysis groups into one for easier site-to-site, tool-to-tool, recipe-to-recipe benchmarking; and category shading in control charts that enhance statistical process control (SPC) analysis by highlighting. It feature configurable time range and drill-down function for
better data aggregation or segregation and data retrieval. Security is always the biggest concern of implementing e-diagnostics. Our system has a Secure Sockets Layer (SSL) that can be configured to secure data transfer within browser-based tools. Access control or user entitlement is also available to allow a managed sharing of the production information.
Web-based Visualized Manufacturing Intelligence- Predictable. Pretentative. Productive.
For emaple, below OCR read-fail tracking demonstrates how a wafer ID is tracked for a set of process tools. It can display in a tool view, lot view, cassette view (with the associated wafer ID's). It also show the the productivity trend of each tools for your to identify the bottleneck of your manufacturing foor. Such information can be easily selected by a range of time by using the cursor or enteing the date range,
Wafer Thickness Monitoring
Tool-@-A-Glance monitoring system will let you viusalize the trend of the thickness by time, by wafer ID, by lot, by recipe, by shift, by tool, by site. Any out of specifcation operation will be red-flagged udring any process step
Wafer ID OCR Read-Fail Tracking
When a wafer ID read-fail is related to a misaligned wafer or inconsistent format or location of scribe, multiple OCR configuration is employed. In order to save the reading time is to avoid the OCR software to sequentially try all configurations until it succeeds or runs out of options and reports a failure-read. This read-fail report can help deciding if which configuration shall be removed or modified to bring up the tool's throughput.
Tool's Utilizaiton
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Virtual Global View
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